Statistical analyses of scatter plots to identify important factors in large-scale simulations, 2: Robustness of techniques

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Original language	English
Pages (from-to)	187-197
Number of pages	10
Journal	Reliability Engineering and System Safety
Volume	65
Issue number	2
Publication status	Published - 1999

OpenUrl availability

@article{519ee52dbbe44379ae158f13fa75ee36,

title = "Statistical analyses of scatter plots to identify important factors in large-scale simulations, 2: Robustness of techniques",

author = "J.P.C. Kleijnen and J.C. Helton",

note = "Pagination: 10",

year = "1999",

language = "English",

volume = "65",

pages = "187--197",

journal = "Reliability Engineering and System Safety",

issn = "0951-8320",

publisher = "Elsevier Limited",

number = "2",

}

TY - JOUR

T1 - Statistical analyses of scatter plots to identify important factors in large-scale simulations, 2

T2 - Robustness of techniques

AU - Kleijnen, J.P.C.

AU - Helton, J.C.

N1 - Pagination: 10

PY - 1999

Y1 - 1999

M3 - Article

SN - 0951-8320

VL - 65

SP - 187

EP - 197

JO - Reliability Engineering and System Safety

JF - Reliability Engineering and System Safety

IS - 2

ER -